Development of new materials requires the versatile approach in research. Atomic Force Microscope can reveal many interesting details about the object of study at nanoscale. Together with Topography imaging, Phase contrast gives us additional information about the local sample properties. In this example, we can see the crystalline-like monolayers found on the surface of polymer coated metal film. Clear difference in phase contrast tells us about the different physico-chemical nature of these areas comparing with the substrate.