710 (South Korea, )

Maze

Sample: AFM image of electrical circuit

Size: 200µm × 200µm

Scientific image: Park System staff

Experimental details
  • System: NX10
  • Scan Mode: True Non-contact Mode
  • Cantilever: AC160TS (k=26 N/m, f=300kHz)
  • Scan Size: 200µm × 200µm
  • Scan Rate: 0.3Hz
  • Pixel: 1024×512
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In collaborazione con: ISTITUTO PER LO STUDIO DEI MATERIALI NANOSTRUTTURATI, NT-MDT, PARK SYSTEM, DYNAMO VELOSTAZIONE, PRA-MA, GAMBETTI, LABTREK, SOCIETA' ITALIANA DI SCIENZE MICROSCOPICHE, MICHELE DELLA CIANA, LIDIA CARLINI